The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Jul. 27, 2017
Applicant:

Smiths Heimann Sas, Vitry sur Seine, FR;

Inventor:

Guillaume Jegou, Vitry sur Seine, FR;

Assignee:

SMITHS HEIMANN SAS, Paris, FR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01V 5/0066 (2013.01); G01N 23/04 (2013.01); G01V 5/0041 (2013.01);
Abstract

In one aspect, it is disclosed a system for inspection of a load, comprising: a detection device configured to detect, after transmission through the load, successive radiation pulses emitted at a predetermined frequency by a source, the load being in movement in an inspection direction, at an inspection speed with respect to the system, the detection device comprising a matrix of a plurality of arrays of detectors, wherein the matrix has a width associated with the inspection direction, the width of the matrix being based on the inspection speed of the load and the predetermined frequency of the successive radiation pulses.


Find Patent Forward Citations

Jegou, Guillaume. (2021). Inspection system with a matrix and method (U.S. Patent No. 10948623). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10948623

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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