The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Aug. 26, 2015
Applicant:

Denso Corporation, Kariya, JP;

Inventor:

Toshiaki Nagai, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/36 (2006.01); G01S 7/493 (2006.01); G01S 7/4914 (2020.01); G01S 7/4915 (2020.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); G01S 7/493 (2013.01); G01S 7/4914 (2013.01); G01S 7/4915 (2013.01); G01S 7/497 (2013.01);
Abstract

In a time-of-flight distance measurement device, a light receiving device is driven by a sequence having a matrix of a phase number n, a value sampled on the basis of the n rank matrix with respect to the phase number n is linearly calculated, and a waveform equivalent to the waveform sampled in a 1/n step is detected. A linear operation is performed on a sampled value based on the matrix with the rank n with respect to the phase number n, thereby being capable of restoring the waveform equivalent to the waveform sampled in the 1/n steps, and determining whether the shape of the light emission waveform is normal, or not. As a result, the shape of the light emission waveform can be monitored without interrupting a distance measurement.


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