The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Mar. 13, 2018
William I. Birurakis, Great Mills, MD (US);
William I. Birurakis, Great Mills, MD (US);
Pioneering Decisive Solutions, Inc., California, MD (US);
Abstract
The invention is a truth table-based failure isolation matrix in an Automated Test Equipment (ATE) environment to enable the mapping of measured results and/or test outcomes to probable causes of failure (PCOF). The failure isolation matrix is hierarchical in that it applies to both individual tests as well as groups of tests. For each level in the hierarchy, columns represent individual outcomes verified against expected results to produce a resultant outcome and rows represent possible combinations of measurement outcomes or outcome vectors. For groups of tests, the measurement results represent the combined results of the individual tests within the test group. The resultant matrix is a pattern of vectors that can be pattern matched against prior history of result patterns to further improve the accuracy and narrow the scope of PCOF.