The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Jul. 03, 2015
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Hiroaki Furukawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01);
Abstract

In order to identify fluorescent X-rays and diffracted X-rays in a software without changing a configuration of an X-ray fluorescence analysis apparatus and to display fluorescent X-ray information and diffracted X-ray information on peaks in a spectrum, the X-ray fluorescence analysis apparatus having an X-ray tube that emits X-rays to a sample and a detector that detects X-rays from the sample and generating and displaying a spectrum indicating a relationship between X-ray energy and an element content based on the X-rays detected by the detector, includes: an identification information generation unit that generates identification information specifying a peak position by a diffracted X-ray caused by a crystal structure of the sample; and a display control unit that displays the diffracted X-ray information on a peak in the spectrum based on the identification information.


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Furukawa, Hiroaki. (2021). X-ray fluorescence analysis device, and spectrum display method used in same (U.S. Patent No. 10948435). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10948435

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