The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Aug. 23, 2019
Applicants:
The Nottingham Trent University, Nottingham, GB;
Cranfield University, Cranfield, GB;
Inventors:
Paul Evans, Nottingham, GB;
Keith Rogers, Swindon, GB;
Assignees:
The Nottingham Trent University, Nottingham, GB;
Cranfield University, Cranfield, GB;
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20008 (2018.01); G01N 23/205 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01N 23/205 (2013.01);
Abstract
A sample inspection apparatus irradiates a sample with a conical shell of X-ray or similar radiation generating a plurality of Debye rings originating from a circular path on the sample. The apparatus is provided with two detectors. A first detector receives diffracted radiation and a second detector receives radiation which is transmitted through a coded aperture provided at a detection surface of the first detector.