The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Apr. 03, 2019
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Dong kyu Cha, Dhahran, SA;

Sultan Enezi, Dhahran, SA;

Mohammed Al Otaibi, Dhahran, SA;

Ali Abdallah Al-Yousef, Dhahran, SA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G01N 33/24 (2006.01); H01J 37/147 (2006.01); G01N 23/225 (2018.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 1/28 (2013.01); G01N 23/225 (2013.01); G01N 33/24 (2013.01); H01J 37/1478 (2013.01); H01J 2237/049 (2013.01); H01J 2237/21 (2013.01); H01J 2237/226 (2013.01); H01J 2237/31749 (2013.01);
Abstract

A process for the preparation and imaging of a sample of rock from an oil and gas reservoir is provided. A sample of reservoir rock may be obtained, such as from a core sample obtained using a core sampling tool inserted in a wellbore extending into an oil and gas reservoir. A photoresist may be deposited on the surface of reservoir rock sample to form a homogenous layer. The photoresist-coated surface of the reservoir rock sample may be imaged using a focused ion beam (FIB). The photoresist protects the pores and other surface features of the rock from damage or implantation by the FIB ion beam and thus minimizes the curtain effect in the resulting images.


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