The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
May. 16, 2018
Applicant:
National Research Council of Canada, Ottawa, CA;
Inventors:
Alain Blouin, Montreal, CA;
Mohamad Sabsabi, Longueuil, CA;
Jean-Pierre Monchalin, Montreal, CA;
Francis Vanier, Boucherville, CA;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/71 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); G01N 21/39 (2013.01); G01N 2201/06113 (2013.01);
Abstract
A method and a system for characterizing an elemental composition and a molecular composition of a material are provided. Laser-based IR spectroscopy measurements and LIBS measurements are performed at a same analysis spot on the material. The IR spectroscopy measurement data can be used to characterize the molecular composition of the material, whereas the LIBS data can be used to characterize the elemental composition of the material. 2D and 3D profiles of a sample of the material may be obtained based on this data.