The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Aug. 19, 2016
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Ns Materials Inc., Fukuoka, JP;
Hiroyuki Nakamura, Ibaraki, JP;
Maki Saeki, Fukuoka, JP;
Masanori Tanaka, Fukuoka, JP;
Eiichi Kanaumi, Fukuoka, JP;
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;
NS MATERIALS INC., Fukuoka, JP;
Abstract
Particularly provided is a method and a system for screening nanoparticles which allow effective search of conditions for surface modification of nanoparticles and reduction in the time, the labor, and the amount of a sample required for the surface modification compared with conventional techniques. The method for screening nanoparticles includes the steps of: dividing a nanoparticle suspension for a respective plurality of containers provided in a containment receptacle; performing surface modification on nanoparticles under different conditions for the respective containers; preparing evaluation samples by adding a dispersion medium into each container and mixing the nanoparticles and the dispersion medium; and performing evaluation on the evaluation sample in each container by optical analysis.