The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Jun. 24, 2016
Massachusetts Institute of Technology, Cambridge, MA (US);
John Haeseon Lee, Cambridge, MA (US);
Brian W. Anthony, Cambridge, MA (US);
Duane S. Boning, Belmont, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
The systems and methods of the present disclosure are directed to ultrasound-based concentration measurement techniques in which both scatterer count and image volume are measured concurrently to provide absolute concentration measurements. In particular, through the techniques of the present disclosure, the effective thickness of an ultrasound beam can be determined based on the spreading of individual scatterers within ultrasound images. Based on the effective thickness of the ultrasound beam, the volume of the image and, thus, the concentration of particles in the image can be determined directly, without the need for estimation, approximation, or use of a reference sample.