The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Jul. 17, 2018
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Reinhard Becker, Ludwigsburg, DE;

Gerrit Hillebrand, Waiblingen, DE;

Martin Ossig, Tamm, DE;

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/00 (2006.01); G01B 5/008 (2006.01); H04N 13/254 (2018.01); H04N 13/239 (2018.01); H04N 13/25 (2018.01); H04N 13/243 (2018.01); H04N 13/00 (2018.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G01B 5/008 (2013.01); G01B 11/005 (2013.01); G06T 7/62 (2017.01); H04N 13/239 (2018.05); H04N 13/25 (2018.05); H04N 13/254 (2018.05); G06T 2207/10152 (2013.01); H04N 13/243 (2018.05); H04N 2013/0081 (2013.01);
Abstract

A method and system for inspecting an object is provided. The system includes a measurement device that measures 3D coordinates of points on a surface of the object. A display is coupled to the device and is sized to be carried by an operator. One or more processors cooperate with the measurement device, to perform a method comprising: determining 3D coordinates of the points while the object is being measured; aligning an electronic model of the object to the points while the object is being measured; determining a variance between the electronic model and the points while the object is being measured; and displaying on the display an indicator when the variance exceeds a threshold while the object is being measured.


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