The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Mar. 14, 2019
Applicant:
Juki Corporation, Tama, JP;
Inventors:
Kimiko Fujie, Tama, JP;
Koji Hiraoka, Tama, JP;
Assignee:
JUKI CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D06H 3/08 (2006.01); G06T 7/00 (2017.01); G01B 11/28 (2006.01); G01N 21/898 (2006.01); G01N 21/956 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
D06H 3/08 (2013.01); G01B 11/022 (2013.01); G01B 11/28 (2013.01); G01N 21/8983 (2013.01); G01N 21/95607 (2013.01); G06T 7/0008 (2013.01); G01N 2021/95615 (2013.01); G06T 2207/30124 (2013.01);
Abstract
A seam inspection device includes an imaging device and a processing device. The imaging device shoots a sewing object supported by a throat plate of a sewing machine and having seams formed therein. And the processing device detects an abnormality of the seam based on an image of the sewing object acquired by the imaging device.