The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Sep. 14, 2018
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Beom Seok Lee, Daejeon, KR;

Ju Young Jeoung, Daejeon, KR;

Kyoung Sik Kim, Daejeon, KR;

Hang Suk Choi, Daejeon, KR;

Eung Jin Jang, Daejeon, KR;

Assignee:

LG CHEM, LTD., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); B29C 65/82 (2006.01); G01N 21/95 (2006.01); G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
B29C 65/8253 (2013.01); G01N 21/95 (2013.01); G01N 2021/9513 (2013.01); G02F 1/1303 (2013.01);
Abstract

Exemplary embodiments of the present invention provide an optical film attachment system which is connected to a downstream device and includes a panel conveyance path, the optical film attachment system including: a connection unit which connects the panel conveyance path and the downstream device and conveys the panel; a first inspection unit which is positioned on the panel conveyance path and finds out whether the panel with the attached optical film has a defect; and a second inspection unit which is positioned at a position spaced apart from the panel conveyance path and re-inspects a defect-determined panel determined as a defective panel by inspection by the first inspection unit; in which the connection unit includes a main conveyance path in which a first conveyance unit and a second conveyance unit are sequentially arranged in a conveyance direction of the panel conveyance path, a first auxiliary conveyance path which connects the first conveyance unit and the second inspection unit and is bypassed from the main conveyance path, and a second auxiliary conveyance path which is connected to the second conveyance unit and bypassed from the main conveyance path, the control unit controls the connection unit so that the defect-determined panel is conveyed from the first conveyance unit to the second inspection unit along the first auxiliary conveyance path when the panel inspected by the first inspection unit is determined as a defective panel, and a good-quality-determined panel determined as a good-quality panel by the first inspection unit is conveyed from the second conveyance unit along the second auxiliary conveyance path when it is difficult to convey the good-quality-determined panel to the downstream device.


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