The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Dec. 20, 2016
Eos Gmbh Electro Optical Systems, Krailling, DE;
Robert Achim Domröse, Germering, DE;
Dominik Wolf, Munich, DE;
Michael Göth, Munich, DE;
Ulrich Schmid, Diessen am Ammersee, DE;
Maximilian Mittermüller, Munich, DE;
EOS GmbH Electro Optical Systems, Krailling, DE;
Abstract
Method for calibrating an apparatus for manufacturing a three-dimensional object by layer-wise selective solidification of building material with the step of generating an substantially periodic first modulation pattern in a first sub-area of the build area, the step of generating an substantially periodic second modulation pattern in a second sub-area of the build area, wherein in the overlap zone, the first modulation pattern and the second modulation pattern form an substantially periodic superposition pattern, whose period is larger than the period of the first modulation pattern and the period of the second modulation pattern, the step of detecting the superposition pattern, and the step of determining the deviation of the position of the superposition pattern on the build area from a reference position.