The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Nov. 20, 2015
Applicant:
Corning Incorporated, Corning, NY (US);
Inventors:
Joseph Henry Citriniti, Corning, NY (US);
Conor James Walsh, Campbell, NY (US);
Assignee:
Corning Incorporated, Corning, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B28B 17/00 (2006.01); B28B 3/26 (2006.01); G01N 21/952 (2006.01); B29C 48/92 (2019.01); B29C 48/11 (2019.01); B29C 48/12 (2019.01); B28B 11/14 (2006.01); B28B 11/24 (2006.01); B29L 31/60 (2006.01); G01N 21/956 (2006.01); B29C 48/30 (2019.01); B28B 3/20 (2006.01);
U.S. Cl.
CPC ...
B28B 17/0072 (2013.01); B28B 3/269 (2013.01); B28B 11/14 (2013.01); B28B 11/243 (2013.01); B29C 48/11 (2019.02); B29C 48/12 (2019.02); B29C 48/92 (2019.02); G01N 21/952 (2013.01); B28B 2003/203 (2013.01); B29C 48/302 (2019.02); B29C 2948/92114 (2019.02); B29C 2948/92295 (2019.02); B29C 2948/92428 (2019.02); B29C 2948/92514 (2019.02); B29C 2948/92609 (2019.02); B29C 2948/92704 (2019.02); B29C 2948/92904 (2019.02); B29L 2031/608 (2013.01); G01N 21/95692 (2013.01); G01N 2201/06113 (2013.01);
Abstract
In-line inspection and control system to in-situ monitor an extrudate during extrusion. A light beam illuminates a line on the outside circumference of the extrudate skin recording the curvature. A master profile of the illuminated defect-free skin is recorded and compared to successive monitoring of the illuminated skin. Differences from the comparison indicate skin and/or shape defects. A real-time feedback to automatically adjust process control hardware reduces or eliminates the skin and shape defects based on the monitoring and comparison.