The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Jun. 24, 2016
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Thomas Koehler, Hamburg, DE;
Gerhard Martens, Henstedt-Ulzburg, DE;
Roland Proksa, Neu Wulmstorf, DE;
Hanns-Ingo Maack, Norderstedt, DE;
Udo Van Stevendaal, Ahrensburg, DE;
Franz Josef Pfeiffer, Unterföhring, DE;
Peter Benjamin Theodor Noel, Unterföhring, DE;
Maximilian Von Teuffenbach, Hamburg, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 5/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/4035 (2013.01); A61B 6/4233 (2013.01); A61B 6/4291 (2013.01); A61B 6/502 (2013.01); A61B 6/4464 (2013.01);
Abstract
An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.