The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Jun. 27, 2019
Applicant:

T-mobile Usa, Inc., Bellevue, WA (US);

Inventors:

Jong Sung Yoon, Sammamish, WA (US);

Leandro L. Recova, Chino, CA (US);

Assignee:

T-Mobile USA, Inc., Bellevue, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 76/11 (2018.01); H04W 64/00 (2009.01); H04B 17/336 (2015.01); H04W 72/04 (2009.01); H04W 4/029 (2018.01);
U.S. Cl.
CPC ...
H04W 76/11 (2018.02); H04B 17/336 (2015.01); H04W 4/029 (2018.02); H04W 64/003 (2013.01); H04W 72/0473 (2013.01);
Abstract

User equipment (UE) can include a network analyzer to capture network metrics to monitor conditions of cell coverage and coverage overlap. In some instances, the UE is served by a neighboring cell located further away instead of the nearest cell due to coverage overlap. The UE can capture data representing network metrics and can report such data to a network device to further aggregate the data and to generate reports. The network device can use the aggregated data to perform overshooting analysis, which may include determining transmission power of neighboring cells that overlap with coverage of a target cell. The aggregated data may be used to determine an overshoot index for a cell. A cell with high overshoot index may be designated an overshooter cell. The parameters of an overshooter cell may be modified to reduce interference between cells.


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