The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Jun. 13, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Masafumi Wakazono, Tokyo, JP;

Yoshimi Tsuboi, Tokyo, JP;

Tadashi Yamaguchi, Saitama, JP;

Haruka Asai, Tokyo, JP;

Kazumi Fukuda, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/04 (2006.01); H04N 5/232 (2006.01); H04N 5/357 (2011.01); G06T 5/00 (2006.01); H04N 5/217 (2011.01); G03B 17/14 (2021.01);
U.S. Cl.
CPC ...
H04N 9/04517 (2018.08); G06T 5/006 (2013.01); H04N 5/2176 (2013.01); H04N 5/232 (2013.01); H04N 5/23203 (2013.01); H04N 5/3572 (2013.01); G03B 17/14 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/30168 (2013.01); H04N 9/0451 (2018.08);
Abstract

In a case where it is determined by a reliability determination sectionthat retention aberration information of an in-apparatus aberration information retention sectionis unreliable, a control sectionsets detection aberration information generated by performing aberration detection processing by a lens aberration detection processing sectionas application aberration information for correcting an aberration of a captured image. In a case where it is determined that the retention aberration information is reliable, the control sectionsets the retention aberration information as the application aberration information. Aberration information can be generated if necessary.


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