The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Jul. 24, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventor:

Patricia Gomes Soares Florissi, Briarcliff Manor, NY (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/923 (2013.01); H04L 12/26 (2006.01); H04L 12/911 (2013.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 47/762 (2013.01); H04L 43/065 (2013.01); H04L 47/783 (2013.01); H04L 67/10 (2013.01);
Abstract

An apparatus in one embodiment comprises at least one processing device having a processor coupled to a memory. The one or more processing devices are operative to configure a plurality of distributed processing nodes to communicate over a network, to abstract content locally accessible in respective data zones of respective ones of the distributed processing nodes into respective catalogs of a distributed catalog service in accordance with a layered extensible data model, and to provide in the distributed processing nodes a plurality of microservices for performing processing operations on at least one of the layered extensible data model and the catalogs. The layered extensible data model comprises a plurality of layers including a core data model layer and at least one extensions layer. The microservices may comprise at least one microservice to alter the layered extensible data model and at least one microservice to query one or more of the catalogs.


Find Patent Forward Citations

Loading…