The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
May. 12, 2017
National Institute of Information and Communications Technology, Koganei, JP;
Takahide Sakamoto, Koganei, JP;
Abstract
To realize sampling (signal measurement) and analysis of a signal to be measured easily at low cost by capturing optical phase fluctuation even when low-speed sampling is carried out. This sampling method includes: a step for acquiring main sampling points at a repetition period equal to or less than a half of the band frequency of a signal to be measured; a step for acquiring sub-sampling points by executing sampling separately from that executed for the main sampling points; a step for acquiring an amplitude difference, a phase difference, and a frequency difference between the signal to be measured at each of the sub-sampling points and a reference signal; a step for acquiring a time difference, an amplitude difference (ΔA), a phase difference (Δφ), and a frequency difference (Δf) between each of the main sampling points and each of the sub-sampling points; and a step for acquiring the amplitude fluctuation, the phase fluctuation, and the frequency fluctuation of the signal to be measured by using the time difference (Δt), the amplitude difference (ΔA), the phase difference (Δφ), and the frequency difference (Δf) between each of the main sampling points and each of the sub-sampling points.