The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Mar. 14, 2016
Applicant:

Samsung Electronics Co., Ltd, Suwon-si, KR;

Inventors:

Jong-Bu Lim, Yongin-si, KR;

Ji-Yun Seol, Seongnam-si, KR;

Byung-Hwan Lee, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04B 17/345 (2015.01); H04B 17/336 (2015.01); H04L 5/14 (2006.01); H04W 88/08 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0617 (2013.01); H04B 7/06 (2013.01); H04B 7/0632 (2013.01); H04B 7/0695 (2013.01); H04B 17/336 (2015.01); H04B 17/345 (2015.01); H04L 5/14 (2013.01); H04W 88/08 (2013.01);
Abstract

The present invention relates to a 5-generation (5G) or pre-5G communication system provided for supporting higher data transmission rates than 4th-generation (4G) communication system such as long term evolution (LTE). The present invention relates to a method in which an access point (AP) operates a full-duplex scheme in a communication system supporting a beam-forming scheme, the method comprising the steps of: generating a magnetic interference intensity table according to transmitted beam patterns and received beam patterns; determining, by the AP, a transmitted beam pattern and a received beam pattern for all stations (STAs) on the basis of channel measurement feedback information received from the stations, which provide service, and the electromagnetic-interference intensity table; and performing a communication operation with each of the stations on the basis of the determined transmitted beam pattern and received beam pattern.


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