The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Nov. 26, 2019
Applicant:

X Display Company Technology Limited, Dublin, IE;

Inventors:

Christopher Bower, Raleigh, NC (US);

Etienne Menard, Voglans, FR;

Matthew Meitl, Durham, NC (US);

Joseph Carr, Chapel Hill, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); H01L 27/12 (2006.01); H01L 21/84 (2006.01); H01L 21/3065 (2006.01); H01L 21/3205 (2006.01); H01L 21/768 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1266 (2013.01); H01L 21/3065 (2013.01); H01L 21/32055 (2013.01); H01L 21/76834 (2013.01); H01L 21/76877 (2013.01); H01L 21/84 (2013.01); H01L 27/124 (2013.01); H01L 27/1214 (2013.01); H01L 27/1222 (2013.01); H01L 27/1248 (2013.01); H01L 29/78666 (2013.01);
Abstract

Methods of forming integrated circuit devices include forming a sacrificial layer on a handling substrate and forming a semiconductor active layer on the sacrificial layer. The semiconductor active layer and the sacrificial layer may be selectively etched in sequence to define an semiconductor-on-insulator (SOI) substrate, which includes a first portion of the semiconductor active layer. A multi-layer electrical interconnect network may be formed on the SOI substrate. This multi-layer electrical interconnect network may be encapsulated by an inorganic capping layer that contacts an upper surface of the first portion of the semiconductor active layer. The capping layer and the first portion of the semiconductor active layer may be selectively etched to thereby expose the sacrificial layer. The sacrificial layer may be selectively removed from between the first portion of the semiconductor active layer and the handling substrate to thereby define a suspended integrated circuit chip encapsulated by the capping layer.


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