The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Mar. 27, 2020
Applicant:

Asm Ip Holding B.v., Almere, NL;

Inventors:

Hyeongeu Kim, Phoenix, AZ (US);

Loren Jacobs, Phoenix, AZ (US);

Peter Westrom, Phoenix, AZ (US);

Assignee:

ASM IP Holding B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 16/46 (2006.01); G01J 5/00 (2006.01); C23C 16/52 (2006.01); G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32954 (2013.01); C23C 16/46 (2013.01); C23C 16/52 (2013.01); G01J 5/0044 (2013.01); G01K 15/005 (2013.01); G01J 2005/0048 (2013.01);
Abstract

Methods for thermally calibrating reaction chambers are provided. In some embodiments, methods may include calculating a first correction factor of a first contact type temperature sensor within a first reaction chamber utilizing a first temperature sensor and applying the first correction factor to a first temperature controller to provide a first calibrated contact type temperature sensor. Embodiments may also include calculating a first calibration factor of a first non-contact type temperature sensor within the first reaction chamber utilizing the first calibrated contact type temperature sensor and applying the first calibration factor to the first non-contact type temperature sensor to provide a first calibrated non-contact type temperature sensor.


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