The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Jul. 30, 2018
Applicants:
George S. Cembrowski, Edmonton, CA;
Junyi Mei, Edmonton, CA;
Inventors:
George S. Cembrowski, Edmonton, CA;
Junyi Mei, Edmonton, CA;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 10/40 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 10/40 (2018.01); G16H 50/20 (2018.01);
Abstract
Generally discussed herein are systems, apparatuses, and methods that relate to altering patient care and increasing the efficacy of medical diagnostics. A standard deviation of deltas (SDD) plot of analyte measurements can provide insights into the medical diagnostics. One or more SDD plots can be used to help diagnose a patient and alter a patient's care depending on the relation of the patient's own SDD plot characteristics relative to the one or more SDD plots. Any or all of the analysis can be automated, such as to reduce human interaction with process.