The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Sep. 07, 2017
Applicants:

Nec Corporation, Tokyo, JP;

Tokyo Institute of Technology, Tokyo, JP;

Inventors:

Takashi Shibata, Tokyo, JP;

Masayuki Tanaka, Tokyo, JP;

Masatoshi Okutomi, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/06 (2006.01); G09G 5/10 (2006.01); G01D 7/00 (2006.01);
U.S. Cl.
CPC ...
G09G 5/06 (2013.01); G01D 7/005 (2013.01); G09G 5/10 (2013.01); G09G 2320/0666 (2013.01); G09G 2340/06 (2013.01);
Abstract

The image data display system according to the present invention makes it possible to comprehend a global distribution of measurement values and a change in details of the measurement values simultaneously. In the present invention, a color information conversion unit converts the measurement values to color information for representing the global distribution of the measurement values. A detail extraction unit extracts detail information of the measurement values from the measurement values. A detail adjustment unit adjusts the strength of detail information and generates adjusted detail information. A color information adding unit adds color information on the basis of the adjusted detail information.


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