The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Jun. 03, 2020
Applicant:

Novatek Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Li-Chieh Chen, Hsinchu, TW;

Yen-Tao Liao, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3208 (2016.01);
U.S. Cl.
CPC ...
G09G 3/3208 (2013.01); G09G 2320/0257 (2013.01); G09G 2320/0285 (2013.01);
Abstract

The present invention provides a decay factor accumulation method for an organic light-emitting diode (OLED) display panel with a variable refresh rate (VRR). The decay factor accumulation method includes detecting an operating frame rate of an input image; generating a decay factor compensation coefficient according to the operating frame rate and a measurement frame rate; and generating a plurality of accumulated decay factors of the input image according to a decay factor lookup table corresponding to the measurement frame rate and the decay factor compensation coefficient.


Find Patent Forward Citations

Chen, Li-Chieh. (2021). Decay factor accumulation method and decay factor accumulation module using the same (U.S. Patent No. 10943531). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10943531

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…