The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Dec. 17, 2018
Applicant:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Inventors:
Jin Sun, Redwood City, CA (US);
Sricharan Kallur Palli Kumar, Mountain View, CA (US);
Raja Bala, Pittsford, NY (US);
Assignee:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/62 (2017.01); G06T 7/143 (2017.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); G06N 3/0454 (2013.01); G06N 3/088 (2013.01); G06N 5/046 (2013.01); G06T 7/143 (2017.01); G06T 7/62 (2017.01);
Abstract
One embodiment can provide a system for detecting outlines of objects in images. During operation, the system receives an image that includes at least one object, generates a random noise signal, and provides the received image and the random noise signal to a shape-regressor module, which applies a shape-regression model to predict a shape outline of an object within the received image.