The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Nov. 30, 2017
Apple Inc., Cupertino, CA (US);
Rui Hu, Santa Clara, CA (US);
Ruslan Salakhutdinov, Pittsburgh, PA (US);
Nitish Srivastava, San Francisco, CA (US);
YiChuan Tang, Mississauga, CA;
Apple Inc., Cupertino, CA (US);
Abstract
A system employs an inspection neural network (INN) to inspect data generated during an inference process of a primary neural network (PNN) to generate an indication of reliability for an output generated by the PNN. The system includes a sensor configured to capture sensor data. Sensor data captured by the sensor is provided to a data analyzer to generate an output using the PNN. An analyzer inspector is configured to capture inspection data associated with the generation of the output by the data analyzer, and use the INN to generate an indication of reliability for the PNN's output based on the inspection data. The INN is trained using a set of training data that is distinct from the training data used to train the PNN.