The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Sep. 15, 2016
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Tomoya Sawada, Tokyo, JP;

Hidetoshi Mishima, Tokyo, JP;

Hideaki Maehara, Tokyo, JP;

Yoshimi Moriya, Tokyo, JP;

Kazuyuki Miyazawa, Tokyo, JP;

Akira Minezawa, Tokyo, JP;

Momoyo Hino, Tokyo, JP;

Mengxiong Wang, Tokyo, JP;

Naohiro Shibuya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/215 (2017.01); G06T 7/10 (2017.01); G06T 7/00 (2017.01); G06T 7/20 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4676 (2013.01); G06K 9/00805 (2013.01); G06K 9/4609 (2013.01); G06T 7/00 (2013.01); G06T 7/10 (2017.01); G06T 7/20 (2013.01); G06T 7/215 (2017.01);
Abstract

An image feature map generating unit () generates, on the basis of feature amounts extracted from a plurality of images successively captured by a camera (), an image feature map which is an estimated distribution of the object likelihood on each of the images. An object detecting unit () detects an object on the basis of the image feature map generated by the image feature map generating unit ().


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