The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Feb. 20, 2018
Applicant:

Palantir Technologies Inc., Palo Alto, CA (US);

Inventors:

Caitlin Colgrove, Palo Alto, CA (US);

Harsh Pandey, New York, NY (US);

Gabrielle Javitt, New York, NY (US);

Assignee:

Palantir Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 16/23 (2019.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/284 (2019.01); G06F 16/23 (2019.01); G06F 16/2456 (2019.01);
Abstract

A first dataset from one or more databases and a second dataset from the one or more databases may be identified. The first dataset may contain first data while the second dataset may contain second data. A first relationship measure may be computed for the first dataset, where the first relationship measure is configured to represent the first data in a first condensed format. A second relationship measure may be computed for the second dataset, where the second relationship measure is configured to represent the second data in a second condensed format. A join key may be computed using the first relationship measure and the second relationship measure. The join key may represent a correspondence area between the first dataset and the second dataset. An interactive user interface element may be configured to display a graphical depiction of the correspondence area between the first dataset and the second dataset.


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