The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Aug. 31, 2018
Olympus Corporation, Tokyo, JP;
Atsushi Doi, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An image acquisition method in which a pulsed illumination beam emitted from a light source is scanned while being focused at a sample, signal light generated as a result of a non-linear optical process at each scanning position is detected, and an image of the sample is generated on a basis of the detected signal light, the image acquisition method including: acquiring a mixed image, which includes in-focus signal light generated at a focal position of the illumination beam in the sample and which also includes out-of-focus signal light; acquiring an image of the out-of-focus signal light on a basis of a plurality of mixed images having mutually different intensities of the out-of-focus signal light; and acquiring an image of the in-focus signal light by subtracting the image of the out-of-focus signal light acquired, from the mixed image acquired.