The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

May. 16, 2019
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Li Zhang, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Yunda Sun, Beijing, CN;

Xin Jin, Beijing, CN;

Ming Chang, Beijing, CN;

Xiaofei Xu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20091 (2018.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0025 (2013.01);
Abstract

The present application discloses an X-ray detection system and method. The detection system includes: a beam source generator, first detectors, a second detector, a collimating device and a processor. The first detectors and the second detector are alternately arranged in a transmission direction of an object to be detected. The beam source generator emits a plurality of columns of beam signals, wherein each column of beam signals comprises a plurality of beam signals; the first detectors receive a plurality of columns of transmitted beam signals passing through the object; the collimating device performs a specificity selection from a plurality of columns of scattered beam signals passing through the object; the second detector receives scattered beam signals selected by the collimating device; and the processor determines a detection result of the object according to the plurality of columns of transmitted beam signals and the selected scattered beam signals.


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