The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Jan. 15, 2016
Landmark Graphics Corporation, Houston, TX (US);
Fan Xia, Katy, TX (US);
Shengwen Jin, Sugar Land, TX (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
Methods and systems are presented in this disclosure for semblance-based anisotropy parameter estimation using isotropic depth-migrated common image gathers. Far-offset image gathers can be generated from seismic data associated with a subterranean formation migrated based on an isotropic depth migration that uses an isotropic velocity model. Based on the far-offset image gathers, a plurality of semblance values can be calculated as a function of an anisotropy parameter of the subterranean formation for the different depths and the surface locations. Effective values of the anisotropy parameter of the subterranean formation can be then chosen that result in maxima of the plurality of semblance values for the different depths and the surface locations. Anisotropy model of the subterranean formation can be obtained based on the effective values of the anisotropy parameter.