The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Feb. 24, 2020
Pictometry International Corp., Rochester, NY (US);
Stephen L. Schultz, West Henrietta, NY (US);
David R. Nilosek, Rochester, NY (US);
David S. Petterson, Avon, NY (US);
Timothy S. Harrington, Rochester, NY (US);
Pictometry International Corp., Rochester, NY (US);
Abstract
Automated methods and systems are disclosed, including a method comprising: obtaining a first three-dimensional-data point cloud of a horizontal surface of an object of interest, the first three-dimensional-data point cloud having a first resolution and having a three-dimensional location associated with each point in the first three-dimensional-data point cloud; capturing one or more aerial image, at one or more oblique angle, depicting at least a vertical surface of the object of interest; analyzing the one or more aerial image with a computer system to determine three-dimensional locations of additional points on the object of interest; and updating the first three-dimensional-data point cloud with the three-dimensional locations of the additional points on the object of interest to create a second three-dimensional-data point cloud having a second resolution greater than the first resolution of the first three-dimensional-data point cloud.