The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Apr. 20, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sung-Yeol Kim, Yongin-si, KR;

Jae-Hong Kim, Seoul, KR;

Kyung-Min Lee, Gwacheon-si, KR;

Mee-Hyun Lim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01N 21/95 (2006.01); G01R 1/07 (2006.01); G02F 1/13 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2853 (2013.01); G01N 21/8806 (2013.01); G01N 21/9501 (2013.01); G01R 1/071 (2013.01); G02F 1/1309 (2013.01);
Abstract

An interconnect circuit testing apparatus including: an electric signal generating circuit for generating an electric signal; a first electrode arranged at a first region of a substrate, wherein the substrate includes an interconnect circuit, an upper surface and a lower surface; a second electrode arranged at a second region of the substrate; and a sensor for detecting an electric field emitted from the first region or the second region when the electric signal is applied to the substrate through the first electrode and the second electrode.


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