The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Nov. 22, 2016
Applicant:

Korea Electric Power Corporation, Naju-si, KR;

Inventors:

Song-Ho Sohn, Daejeon, KR;

Sang-Cheol Han, Daejeon, KR;

Hyung-Suk Yang, Daejeon, KR;

Seong-Woo Yim, Daejeon, KR;

Yong-June Shin, Seoul, KR;

Geon-Seok Lee, Seoul, KR;

Su-Sik Bang, Seoul, KR;

Yeong-Ho Lee, Seoul, KR;

Gu-Young Kwon, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/11 (2006.01); G01R 23/16 (2006.01); G01R 31/58 (2020.01); G01R 31/08 (2020.01); G01R 23/165 (2006.01);
U.S. Cl.
CPC ...
G01R 31/11 (2013.01); G01R 23/16 (2013.01); G01R 23/165 (2013.01); G01R 31/08 (2013.01); G01R 31/58 (2020.01);
Abstract

A reflected-wave processing apparatus according to one embodiment of the present invention may comprise: a reference signal generation unit for applying, to a cable, a first reference signal, the frequency of which increases over time, and a second reference signal, the frequency of which decreases over time; a reflected-signal acquisition unit for acquiring a first reflected signal and a second reflected signal which are reflected from the cable upon applying the first and second reference signals thereto; and a signal analysis unit for analyzing the first and second reflected signals.


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