The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Feb. 07, 2019
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;
Setsu Yamamoto, Yokohama, JP;
Jun Semboshi, Yokohama, JP;
Azusa Sugawara, Kawasaki, JP;
Kentaro Tsuchihashi, Yokohama, JP;
Masaru Otsuka, Ota, JP;
KABUSHIKl KAISHA TOSHIBA, Tokyo, JP;
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION, Kawasaki, JP;
Abstract
According to embodiments, an ultrasonic inspection apparatus comprises: an ultrasonic array probe having a plurality of ultrasonic elements; an estimated shape reflected wave arrival time calculator for computing the estimated shape reflected wave arrival time for the estimated shape reflected wave on the basis of the estimated sound velocity in the test object; an actual shape reflected wave arrival time extractor for extracting the actual shape reflected wave arrival time on the basis of the actual shape reflected wave; a shape reflected waves time difference calculator for computing the difference by subtracting the actual shape reflected wave arrival time from the estimated shape reflected wave arrival time as shape reflected waves time difference; and a delay time calculator for computing the delay times for mutually shifting the timings of ultrasonic wave transmission and ultrasonic wave reception by the ultrasonic elements, considering the shape reflected waves time differences.