The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Nov. 11, 2019
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventor:

Jin Ho Lee, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/896 (2006.01); G06T 7/00 (2017.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/896 (2013.01); G01N 21/8851 (2013.01); G06T 7/0004 (2013.01); G01N 2021/8887 (2013.01);
Abstract

An apparatus and method for inspecting a glass substrate. The apparatus for inspecting a glass substrate includes a stage configured to support the glass substrate, a first light source for irradiating light onto a surface of the glass substrate at a first angle, a first camera for capturing scattered light of the light irradiated from the first light source, a second light source for irradiating light onto the surface of the glass substrate at a second angle greater than the first angle, a second camera for capturing reflected light and scattered light of the light irradiated from the second light source, and a defect detection unit for detecting a defect of the glass substrate using a first image provided by the first camera and a second image provided by the second camera.


Find Patent Forward Citations

Lee, Jin. (2021). Apparatus and method for inspecting glass substrate (U.S. Patent No. 10942132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10942132

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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