The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Nov. 15, 2018
Applicant:

Agc Inc., Chiyoda-ku, JP;

Inventors:

Wataru Kasai, Chiyoda-ku, JP;

Kengo Kawahara, Chiyoda-ku, JP;

Assignee:

AGC Inc., Chiyoda-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 48/885 (2019.01); C08J 5/18 (2006.01); B29C 48/08 (2019.01); B29C 48/305 (2019.01); B29C 48/88 (2019.01); C08F 210/02 (2006.01); C08F 214/26 (2006.01); B29K 627/18 (2006.01); B29K 23/00 (2006.01); B29K 27/18 (2006.01); B29L 7/00 (2006.01); C08L 27/18 (2006.01); C08L 23/08 (2006.01); B29C 48/00 (2019.01); B29K 627/12 (2006.01);
U.S. Cl.
CPC ...
B29C 48/885 (2019.02); B29C 48/022 (2019.02); B29C 48/08 (2019.02); B29C 48/305 (2019.02); B29C 48/914 (2019.02); C08F 210/02 (2013.01); C08F 214/265 (2013.01); C08J 5/18 (2013.01); C08L 23/0892 (2013.01); C08L 27/18 (2013.01); B29K 2023/08 (2013.01); B29K 2027/18 (2013.01); B29K 2627/12 (2013.01); B29K 2627/18 (2013.01); B29L 2007/00 (2013.01); C08F 2500/26 (2013.01); C08F 2800/20 (2013.01); C08J 2327/18 (2013.01); C08J 2427/18 (2013.01); C08L 2205/025 (2013.01);
Abstract

To provide an ETFE film which is unlikely to wrinkle when stretched and retracted, and a method for producing the same. It is an ethylene-tetrafluoroethylene copolymer film characterized in that the crystallinity obtained by the formula (1) from the peak area Sin the vicinity of 2θ=20°, the peak area Sin the vicinity of 2θ=19° and the peak area Sin the vicinity of 2θ=17° in the diffraction intensity curve obtained by the X-ray diffraction method, is from 55 to 70%, and the proportion of the quasi-crystal layer obtained by the formula (2) is from 10 to 20%:crystallinity (%)=()/()×100  (1)proportion of quasi-crystal layer (%)=/()×100  (2).


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