The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
May. 03, 2018
Fujifilm Corporation, Tokyo, JP;
Takaaki Saito, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a processor device, an endoscope system, and an image processing method capable of discovering not only a lesion in which scattering particles according to a specific scattering model are present but also various lesions. A processor deviceincludes an image acquisition unitthat acquires images of three wavelength ranges of a blue wavelength range, a green wavelength range, and a red wavelength range; a scattering characteristic amount calculation unitthat calculates a scattering characteristic amount representing a scattering characteristic of an observation object, using the images of the three wavelength ranges; and an image generation unitthat generates a scattering characteristic amount image representing a distribution of the scattering characteristic amount.