The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2021
Filed:
Oct. 19, 2018
Applicant:
Carl Zeiss Meditec Ag, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); A61B 3/10 (2006.01); A61B 3/13 (2006.01); G02B 21/00 (2006.01); A61F 9/008 (2006.01); A61B 18/20 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1035 (2013.01); A61B 3/102 (2013.01); A61B 3/1015 (2013.01); A61B 3/13 (2013.01); A61B 18/20 (2013.01); A61F 9/008 (2013.01); A61F 9/00821 (2013.01); A61F 9/00825 (2013.01); G02B 21/00 (2013.01); G02B 21/0012 (2013.01); G02B 21/082 (2013.01); A61B 2018/20359 (2017.05); A61F 2009/0087 (2013.01); A61F 2009/00848 (2013.01); A61F 2009/00851 (2013.01); A61F 2009/00863 (2013.01);
Abstract
A microscope, comprising an observation beam path that renders an eye to be examined observable, a wavefront measuring device for measuring the refraction of the eye to be examined, an OCT device comprising an OCT illumination beam path, by means of which OCT illumination radiation can be focused as an OCT spot into the eye to be examined, and a control unit that is supplied with at least one measurement value of the wave front measuring device, is provided, wherein the control unit sets the beam diameter and/or the beam shape of the OCT spot on the basis of the at least one supplied measurement value.