The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Feb. 25, 2020
Sprint Spectrum L.p., Overland Park, KS (US);
Sanghoon Sung, Ashburn, VA (US);
Udit Thakore, Fairfax, VA (US);
Yu Wang, Fairfax, VA (US);
George W. Harter, III, Ashburn, VA (US);
Sprint Spectrum L.P., Overland Park, KS (US);
Abstract
A mechanism for controlling secondary-coverage scanning for configuring dual-connectivity. A computing system establishes for a primary access node a scan list of secondary cells based on the primary access node having an X2 interface for each secondary cell and having received a threshold extent of B1 measurement reporting indicating threshold strong coverage of the secondary cell for configuration of dual-connectivity. Further, the computing system establishes for each secondary cell of the scan list a respective B1 measurement threshold based on evaluation of performance history of the secondary cell such as based on extent of secondary-access-node-addition failures involving the secondary cell and/or based on communication-quality metrics such as error rate or retransmission rate. The computing system then configures the primary access node to provide a B1 measurement object conveying the scan list with measurement thresholds.