The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Jan. 03, 2020
Fujifilm Corporation, Tokyo, JP;
Kenta Matsubara, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An observation device includes: a structured illumination section; a phase difference measurement illumination section; a phase contrast lens that has a phase plate for dimming illumination light for phase difference measurement, where the illumination light for phase difference measurement is incident into the lens, and the structured illumination light is incident into the lens from a side opposite to an incidence side of the ring-shaped illumination; a detection section that detects reflected light of the structured illumination light; and an observation section that images the illumination light for phase difference measurement. When Fourier transform is performed on the structured illumination light, a spatial frequency of the structured illumination light is set on a high-frequency side or a low-frequency side with respect to a position of the phase plate on optical Fourier space.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile