The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Feb. 14, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventor:

Yutaka Kato, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G01N 21/55 (2014.01); G01N 21/88 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2256 (2013.01); G01N 21/55 (2013.01); G01N 21/8851 (2013.01); G06K 9/6215 (2013.01); G06T 7/001 (2013.01); H04N 5/232 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30164 (2013.01);
Abstract

An image processing system, an image processing device and an image processing method that can improve performance of an image measurement are provided. A control device controls a light emission portion in a manner that each of plural types of partial regions set on a light emission surface emits light, and controls a camera to image an object in synchronization with light emission of each of the plural types of partial regions. The control device performs an image measurement of the object based on reflection profile information which is generated based on a plurality of input images, and the reflection profile information shows a relationship between positions within the light emission surface and degrees of light reflected at attention sites of the object and incident to the camera with respect to light irradiated from the position to the object.


Find Patent Forward Citations

Loading…