The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Aug. 17, 2020
Realtek Semiconductor Corporation, Hsinchu, TW;
Ka-Un Chan, Hsinchu County, TW;
Chih-Lung Chen, Hsinchu County, TW;
Chia-Jun Chang, Hsinchu, TW;
Po-Chih Wang, Hsinchu County, TW;
REALTEK SEMICONDUCTOR CORPORATION, Hsinchu, TW;
Abstract
Disclosed is a radio-frequency (RF) circuit capable of performing an RF characteristic test in a test mode. The RF circuit includes: a test signal generator generating a test signal; an RF receiver, coupled to the test signal generator, transmitting the test signal and thereby generating a receiver analog signal; a coupling circuit transmitting the receiver analog signal to an RF transmitter in the test mode; the RF transmitter transmitting the receiver analog signal and thereby generating a transmitter analog signal; a test result generator, coupled between the RF transmitter and a test result output terminal, including a signal converter for generating a converted signal according to the transmitter analog signal in the test mode, wherein the output signal at the test result output terminal is the converted signal or originated therefrom and relates to the result of the RF characteristic test.