The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Dec. 18, 2019
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Eran Sharon, Rishon Lezion, IL;

Alexander Bazarsky, Holon, IL;

Ariel Navon, Revava, IL;

Omer Fainzilber, Even-Yehuda, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/45 (2006.01); H03M 13/11 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
H03M 13/458 (2013.01); G06F 11/1012 (2013.01); H03M 13/1111 (2013.01); G11C 29/52 (2013.01); G11C 2029/0411 (2013.01);
Abstract

A memory system configured to decode a data set may pause a convergence process to update reliability metric values. The memory system may utilize a positive feedback system that updates the reliability metric values by analyzing current a posteriori reliability metric values to calculate average estimated reliability characteristic values associated with a memory error model. The updates to the reliability metric values may provide increased error correction capability and faster decoding.


Find Patent Forward Citations

Sharon, Eran. (2021). Decoding optimization for channel mismatch (U.S. Patent No. 10938421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10938421

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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