The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Jan. 11, 2019
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Carlo Marbella, Singapore, SG;

Kheng-Jin Chan, Singapore, SG;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/31 (2006.01); H01L 23/00 (2006.01); H01L 21/683 (2006.01); H01L 21/48 (2006.01); H01L 21/56 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3114 (2013.01); H01L 21/4832 (2013.01); H01L 21/561 (2013.01); H01L 21/6835 (2013.01); H01L 24/12 (2013.01); H01L 24/32 (2013.01); H01L 24/48 (2013.01); H01L 24/97 (2013.01);
Abstract

A substrate includes a dielectric layer, a first metal bar, a plurality of first traces, a plurality of first openings, a second metal bar, and at least one second opening. The dielectric layer has a first major surface and a second major surface opposite to the first major surface. The first metal bar is on the first major surface. The plurality of first traces are on the first major surface. Each first trace is connected at one end to the first metal bar. The plurality of first openings expose the dielectric layer on the first major surface and intersect a first trace. The second metal bar is on the second major surface. The at least one second opening exposes the dielectric layer on the second major surface and intersects the second metal bar. The first openings are laterally offset with respect to the at least one second opening.


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