The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Jun. 15, 2017
Sun Yat-sen University, Guangdong, CN;
Chongyu Chen, Guangdong, CN;
Liang Lin, Guangdong, CN;
SUN YAT-SEN UNIVERSITY, Guangzhou, CN;
Abstract
Provided is an image deblurring algorithm based on a sparse positive source separation model. The image deblurring algorithm is used for performing processing on a blurry image collected by an optical microscopic imaging system and generated due to diffraction effect and optical deviation; under a condition of single light sensitive imaging and of not increasing an external imaging device, a spatial resolution of the optical microscopic system may be improved to a nanoscale. In the disclosure, a blurring process of microscopic imaging is expressed as a linear combination of a Point Spread Function of the imaging system; by embedding the process into a positive separation optimized frame, adding a sparsity constraint and solving to remove blurring, the high-resolution microscopic imaging is implemented.