The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Jan. 16, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Mayumi Suzuki, Tokyo, JP;

Takuma Shibahara, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/33 (2019.01); G06F 40/30 (2020.01); G06F 16/93 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/3344 (2019.01); G06F 40/30 (2020.01); G06F 16/93 (2019.01);
Abstract

To provide an optimum hyper parameter for determining a learning model using a natural language as a target. An optimization apparatus including: a processor and a memory and performing learning of a document set by natural language processing has an optimization section configured to determine a hyper parameter satisfying a predetermined condition on the basis of previously set group data, generate a learning model by the determined hyper parameter, and acquire a high-dimensional vector from the learning model; and a high-dimensional visualization section configured to convert the high-dimensional vector of a word or document as an analysis target on the basis of the group data.


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