The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Apr. 19, 2017
Applicant:
Xerox Corporation, Norwalk, CT (US);
Inventors:
Helen Haekyung Shin, Fairport, NY (US);
Matthew John Quirk, Webster, NY (US);
Assignee:
Xerox Corporation, Norwalk, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/00 (2012.01); G06Q 50/22 (2018.01); G16H 50/30 (2018.01); G06F 16/21 (2019.01); G06N 7/00 (2006.01); G06N 5/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/219 (2019.01); G06N 5/003 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01);
Abstract
Disclosed is a diagnostic method and system including the processing of historical event logs generated by one or more devices. According to an exemplary embodiment, a diagnostic system includes an event log acquisition module, an event classification module classifying event logs acquired, and a diagnostic module generating a labeled version of the historical event log including labels provided by the classification module. The event classification module is trained using supervised machine learning techniques.