The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

May. 26, 2020
Applicant:

Qumulo, Inc., Seattle, WA (US);

Inventors:

Thomas R. Unger, Seattle, WA (US);

Michael Patrick Kirby, Lynnwood, WA (US);

Thomas Scott Urban, Seattle, WA (US);

Michael R. Fitz, Seattle, WA (US);

Boyu Zhang, Seattle, WA (US);

Assignee:

Qumulo, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); G06F 16/11 (2019.01); G06F 16/182 (2019.01);
U.S. Cl.
CPC ...
G06F 16/11 (2019.01); G06F 16/182 (2019.01);
Abstract

Embodiments are directed to managing data in a file system. A query may be provided to determine characteristics associated with a file system and a sampling model. The sampling model may be employed to determine objects in the file system based on a traversal of the file system. The sampling model may be employed to determine metrics associated with the alternate data streams (ADSs) included in the objects such that each of the objects that includes a separate main data stream and the ADSs may be associated with data blocks and the ADSs may each be associated with other data blocks. The sampling model and the query may be employed to sample the objects to provide partial results such that the sampling may be distributed between the objects based on the sampling model and the metrics. A result to the query may be provided based on the partial results.


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